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Atomic force microscopy is a type of high resolution scanning probe microscopy. AFM forms images of surfaces using a cantilever with a sharp tip that functions as a probe. AMF has resolution at the level of fractions of a nanometer. AMF can be used to image, measure and manipulate matter at the nanoscale level. Information is gathered by deflection of a mechanical probe. As the tip of the probe is moved into very close proximity to the sample surface, forces between the tip and the sample lead to deflection of the cantilever. Types of forces contributing to deflection of the cantilever include: mechanical contact forces, solvation forces, magnetic forces, electrostatic forces, van der Waals forces, and capillary forces.